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Creators/Authors contains: "Dorrer, C."

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  1. ; ; ; (, Imaging and Applied Optics Congress, OSA Technical Digest (Optical Society of America, 2020))
    Wavefront generated by freeform phase plate is measured with an optical differentiation wavefront sensor. Comparison of the measurement with a commercial scanning interferometer shows M0 (A=633 nm) agreement, demonstrating its potential for metrology applications. 
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  2. ; (, Applied Optics)
  3. ; (, CLEO: Science and Innovations 2018)
    Direct binary search is used to optimize spatially dithered distributions of transparent and opaque pixels for beam shaping, improving the performance of spatial gain precompensation for laser systems, and wavefront metrology by optical differentiation. 
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  4. ; ; (, Optics Express)
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